Dr. Stanislav Kratky Profile

Dr. Stanislav Kratky

at Institute of Scientific Instruments of the CAS vvi

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Author

Publications (4)

Proceedings Article | 4 March 2019 Presentation

Surface-enhanced Raman spectroscopy in microfluidic chips for directed evolution of enzymes and environmental monitoring (Conference Presentation)

Zdenek Pilát, Jan Jezek, Martin Kizovsky, Tereza Klementova, Stanislav Kratky, Jaroslav Sobota, Ota Samek, Pavel Zemanek, Tomas Buryska, Jiri Damborsky, Zbynek Prokop

Proceedings Volume 10894, 1089415 (2019) https://doi.org/10.1117/12.2509900

KEYWORDS: Surface enhanced Raman spectroscopy, Microfluidics, Environmental monitoring, Silicon, Optofluidics, Nanostructuring, Nanolithography, Lithography, Wet etching, Gold

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Proceedings Article | 18 December 2018 Paper

Surface-enhanced Raman spectroscopy of chloroalkanes in microfluidic chips

Zdeněk Pilát, Martin Kizovský, Jan Ježek, Stanislav Krátký, Jaroslav Sobota, Martin Šiler , Ota Samek , Tomáš Buryška , Pavel Vaňáček , Jiří Damborský , Zbyněk Prokop , Pavel Zemánek

Proceedings Volume 10976, 1097619 (2018) https://doi.org/10.1117/12.2518393

KEYWORDS: Surface enhanced Raman spectroscopy, Raman spectroscopy, Microfluidics, Chemical analysis, Calibration, Molecules, Optofluidics, Analytical research, Biological research, Gold

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Proceedings Article | 18 December 2018 Paper

Laser system for measuring MEMS relief created by the method of deep reactive ion etching

Tadeáš Maňka, Mojmír Šerý, Stanislav Krátký, Pavel Zemánek

Proceedings Volume 10976, 109760M (2018) https://doi.org/10.1117/12.2518098

KEYWORDS: Etching, Deep reactive ion etching, Microelectromechanical systems, Silicon, Interferometers, Signal detection, Reactive ion etching, Laser systems engineering, Laser interferometry

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Proceedings Article | 15 May 2017 Paper

Phyllotactic arrangements of optical elements

M. Horacek, P. Meluzin, S. Kratky, M. Matejka, V. Kolarik

Proceedings Volume 10233, 102331G (2017) https://doi.org/10.1117/12.2265835

KEYWORDS: Electron beams, Statistical analysis, Lithography, Diffraction gratings, Diffraction, Electron beam lithography, Holography, Algorithm development, Metals, Performance modeling

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