Dr. Stephan Lutgen
uLED Architect and Platform Lead
SPIE Involvement:
Author
Publications (14)

Proceedings Article | 17 February 2011 Paper
Stephan Lutgen, Dimitri Dini, Ines Pietzonka, Soenke Tautz, Andreas Breidenassel, Alfred Lell, Adrian Avramescu, Christoph Eichler, Teresa Lermer, Jens Müller, Georg Bruederl, Alvaro Gomez-Iglesias, Uwe Strauss, Wolfgang Scheibenzuber, Ulrich Schwarz, Bernhard Pasenow, Stephan Koch
Proceedings Volume 7953, 79530G (2011) https://doi.org/10.1117/12.874757
KEYWORDS: Semiconductor lasers, Laser damage threshold, Diodes, Indium gallium nitride, Gallium nitride, Laser applications, Pulsed laser operation, Waveguides, Temperature metrology, Continuous wave operation

Proceedings Article | 11 March 2010 Paper
J. Müller, G. Brüderl, M. Schillgalies, A. Breidenassel, S. Tautz, D. Dini, T. Lermer, S. Lutgen, U. Strauß
Proceedings Volume 7602, 760222 (2010) https://doi.org/10.1117/12.842130
KEYWORDS: Indium gallium nitride, Semiconductor lasers, Testing and analysis, Laser damage threshold, Quantum wells, Gallium nitride, Applied physics, Quantum efficiency, Laser applications, Light sources

Proceedings Article | 18 February 2010 Paper
T. Hoefer, M. Schmitt, T. Schwarz, M. Kuehnelt, R. Schulz, I. Pietzonka, H. Lindberg, C. Lauer, S. Lutgen, U. Steegmueller, U. Strauss
Proceedings Volume 7582, 758207 (2010) https://doi.org/10.1117/12.842494
KEYWORDS: Semiconductor lasers, Laser applications, Projection systems, Modulation, Silicon, Reliability, Mirrors, Crystals, Heads up displays, Laser damage threshold

Proceedings Article | 12 February 2010 Paper
Stephan Lutgen, Adrian Avramescu, Teresa Lermer, Marc Schillgalies, Desiree Queren, Jens Müller, Dimitri Dini, Andreas Breidenassel, Uwe Strauss
Proceedings Volume 7616, 76160G (2010) https://doi.org/10.1117/12.842131
KEYWORDS: Semiconductor lasers, Continuous wave operation, Indium gallium nitride, Diodes, Gallium nitride, Pulsed laser operation, Laser damage threshold, Electroluminescence, Waveguides, Charged particle optics

Proceedings Article | 19 February 2009 Paper
Proceedings Volume 7216, 72161C (2009) https://doi.org/10.1117/12.807979
KEYWORDS: Temperature metrology, Semiconductor lasers, Laser damage threshold, Indium gallium nitride, Quantum wells, Resistance, Continuous wave operation, Doping, Cell phones, Laser applications

Showing 5 of 14 publications
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