Mr. Sören Gärtner Profile

Sören Gärtner

at ViALUX GmbH

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Proceedings Article | 4 March 2019 Presentation + Paper

Generating high-precision grayscale line profiles using DLP at maximum speed

Roland Höfling, Frank Leischnig, Sören Gärtner, Petra Aswendt

Proceedings Volume 10932, 109320H (2019) https://doi.org/10.1117/12.2506881

KEYWORDS: Industrial metrology, Digital Light Processing, Sensors, Phase shifting, Inspection, 3D metrology, Structured light

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Using DLP^® projection for 3D surface measurement is well established and very high-speed recording has been reported using binary structured light patterns. Advanced 3D measuring solution adopt phase shifting technology that yields higher data quality and increases the robustness of the inspection systems. Phase shifting requires the projection of precise sinusoidal patters. DLP chips produce native binary intensity modulation patterns and the grayscale output is typically realized by time averaging of the binary bit planes using pulse width modulation. That way, very precise grayscale line profiles can be projected but the pattern rates do not exceed 1200 fps substantially. This paper describes a novel methodology for precise grayscale line projection with up to 10-bit gray values and pattern frequencies that correspond to the maximum DLP pattern refresh rate. The basic principle of this new approach has been verified analyzing phase shifting pattern sequences recorded by an integrated camera. Precise 8-bit line profiles have been generated and the maximum of 50,000 profiles per second can be achieved with partial use of the DLP micro-mirror array. Experimental results are presented that are not only promising for future use in 3D surface inspection but have potential for other areas of industrial DLP applications as well.

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