Prof. Takamasa Suzuki
Professor at Niigata Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (99)

Proceedings Article | 7 June 2024 Presentation + Paper
Proceedings Volume 13041, 1304104 (2024) https://doi.org/10.1117/12.3013634
KEYWORDS: Digital holography, Speckle, Image enhancement, Biomedical optics, Polarization

Proceedings Article | 8 December 2022 Paper
Haosen Pu, Osami Sasaki, Takamasa Suzuki, Samuel Choi
Proceedings Volume 12480, 124800B (2022) https://doi.org/10.1117/12.2660168
KEYWORDS: Spiral phase plates, Phase shift keying, Interferometry, Scanning probe microscopy, Phase measurement, Optical vortices, Spatial light modulators, Phase modulation, Gaussian beams, Computer generated holography

Proceedings Article | 1 November 2021 Paper
Takamasa Suzuki, Jiro Shimazaki, Osami Sasaki, Samuel Choi
Proceedings Volume 12057, 120574L (2021) https://doi.org/10.1117/12.2606987
KEYWORDS: Signal detection, Continuous wavelet transforms, Mirrors, Optical coherence tomography, Signal processing, Ferroelectric materials, Continuous wave operation, Wavelets, 3D metrology, Light sources

Proceedings Article | 9 October 2021 Presentation + Paper
Kaining Zhang, Samuel Choi, Osami Sasaki, Songjie Luo, Takamasa Suzuki, Jixiong Pu
Proceedings Volume 11899, 118990A (2021) https://doi.org/10.1117/12.2601233
KEYWORDS: Signal detection, Glasses, Fourier transforms, Interferometers, Spectral resolution, Phase measurement

SPIE Journal Paper | 26 March 2020
OE, Vol. 59, Issue 03, 034112, (March 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.3.034112
KEYWORDS: Interferometers, Phase shifts, Signal detection, CCD cameras, Digital signal processing, Cameras, Signal processing, Optical engineering, Phase shift keying, Modulation

Showing 5 of 99 publications
Conference Committee Involvement (21)
Optical Metrology and Inspection for Industrial Applications XII
11 October 2025 | Beijing, China
Optical Technology and Measurement for Industrial Applications Conference
21 April 2025 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications XI
12 October 2024 | Nantong, Jiangsu, China
Optical Technology and Measurement for Industrial Applications Conference
22 April 2024 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications X
15 October 2023 | Beijing, China
Showing 5 of 21 Conference Committees
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top