Prof. Takashi Nomura Profile

Prof. Takashi Nomura

Associate Professor at Toyama Prefectural Univ

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 20 November 2012 Paper

Dynamic measurements by the color grating projection method using a two-step Fourier transform method

Kazuhide Kamiya, Takashi Nomura, Ami Tanbo, Matsumoto Kimihisa, Tashiro Hatsuzou, Shinya Suzuki

Proceedings Volume 8563, 856313 (2012) https://doi.org/10.1117/12.999769

KEYWORDS: Fourier transforms, Bandpass filters, Signal processing, CCD cameras, Shape analysis, Optical filters, Testing and analysis, Image analysis, Phase shifting, Signal generators

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Proceedings Article | 8 May 2001 Paper

Position-sensing grating interferometer for a specular object: analysis considering the aberration

Kazuhide Kamiya, Takashi Nomura, Seiichi Okuda, Hatsuzo Tashiro, Kazuo Yoshikawa

Proceedings Volume 4416, (2001) https://doi.org/10.1117/12.427099

KEYWORDS: Interferometers, Mirrors, Wavefronts, Diffraction gratings, Zernike polynomials, Monochromatic aberrations, Facility engineering, Error analysis, Polysomnography

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Proceedings Article | 7 May 1999 Paper

Improvement of precision in the analysis of a lateral shearing interferogram using integration

Seiichi Okuda, Takashi Nomura, Kazuhide Kamiya, Hiroshi Miyashiro, Kazuo Yoshikawa, Hatsuzo Tashiro

Proceedings Volume 3740, (1999) https://doi.org/10.1117/12.347763

KEYWORDS: Wavefronts, Shape analysis, Shearing interferometers, Zernike polynomials, Computer simulations, Photovoltaics, Error analysis, Interferometers, Turbulence, Optical engineering

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Proceedings Article | 20 October 1992 Paper

Application of a fringe scanning method to zone-plate interferometry

Takashi Nomura, Hiroshi Miyashiro, Kazuhide Kamiya, Kazuo Yoshikawa, Hatsuzo Tashiro, Shigeo Ozono, Masane Suzuki

Proceedings Volume 1720, (1992) https://doi.org/10.1117/12.132139

KEYWORDS: Interferometers, Fringe analysis, Diffraction, Interferometry, Shape analysis, Error analysis, Optical testing, Diffraction gratings, Beam shaping, Manufacturing

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Proceedings Article | 20 October 1992 Paper

Analysis of zone-plate interference fringe pattern

Kazuhide Kamiya, Takashi Nomura, Hiroshi Miyashiro, Kazuo Yoshikawa, Hatsuzo Tashiro, Shigeo Ozono, Masane Suzuki

Proceedings Volume 1720, (1992) https://doi.org/10.1117/12.132138

KEYWORDS: Fringe analysis, Interferometers, Fizeau interferometers, Optics manufacturing, Manufacturing, Cutting equipment, Systems engineering, Interferometry, Fourier transforms, Error analysis

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Showing 5 of 6 publications

Conference Committee Involvement (1)

Optical Metrology and Inspection for Industrial Applications

18 October 2010 | Beijing, China

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