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Prof. Thierry Guillet
Professor at Univ Montpellier-CNRS
SPIE Involvement:
Author
Area of Expertise:
III-nitride , Microlaser , Polariton , Integrated Photonics
Websites:
Company Website
Profile Summary
Thierry Guillet is a professor at Montpellier University and the Laboratoire Charles Coulomb (L2C, CNRS-UM). He is an expert in light-matter coupling in wide bandgap semiconductors, from GaN polariton physics to photonic crystals, microdisks and microlasers.
Publications (3)
Proceedings Article | 1 August 2021 Presentation
GaN microlasers for integrated photonics: waveguide polariton lasers and microdisk lasers
Proceedings Volume 11801, 118010B (2021) https://doi.org/10.1117/12.2594565
KEYWORDS: Waveguides, Polaritons, Gallium nitride, Waveguide lasers, Integrated photonics, Resonators, Quantum wells, Near ultraviolet, Fabry–Perot interferometers
Proceedings Article | 14 March 2018 Presentation
III-nitride on silicon microdisks: electrical injection and bus waveguide side-coupling (Conference Presentation)
Farsane Tabataba-Vakili, Iännis Roland, Stéphanie Rennesson, Eric Frayssinet, Julien Brault, Moustafa El Kurdi, Xavier Checoury, Bruno Paulillo, Raffaele Colombelli, Thierry Guillet, Christelle Brimont, Benjamin Damilano, Fabrice Semond, Bruno Gayral, Philippe Boucaud
Proceedings Volume 10532, 105321K (2018) https://doi.org/10.1117/12.2289556
KEYWORDS: Waveguides, Silicon, Nanophotonics, Microresonators, Laser sources, Optical pumping, Electroluminescence, Quantum wells, Ultraviolet radiation, Integrated circuit design
Proceedings Article | 13 March 2015 Paper
Optical properties of small GaN/Al0.5Ga0.5N quantum dots grown on (11-22) GaN templates
Julien Sellés, Daniel Rosales, Bernard Gil, Guillaume Cassabois, Thierry Guillet, Julien Brault, Benjamin Damilano, Philippe Vennéguès, Philippe de Mierry, Jean Massies
Proceedings Volume 9363, 93630Z (2015) https://doi.org/10.1117/12.2076284
KEYWORDS: Luminescence, Gallium nitride, Quantum dots, Polarization, Crystals, Optical properties, Ranging, Photons, Temperature metrology, Molecular beam epitaxy
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