Defects in master and replica waveguide gratings can cause image quality issues on AR displays. Characterizing these gratings is difficult due to their small features, which can be smaller than the wavelength of visible light. Microscopy is unsuitable for production testing as it lacks resolution and can be destructive. The authors propose an optical metrology setup using Littrow configuration to accurately measure diffraction grating pitch and orientation at a picometer and arcsecond scale to identify defects. The authors will also demonstrate the impact of grating analysis on the image quality of diffractive waveguides.
Augmented Reality (AR) waveguide metrology requires placing the measurement camera next to the projection optics, thereby complicating system referencing, which requires the camera to be opposite to the projection optics, not next to it. The traditional mechanical solution of rotating and repositioning the camera is expensive and error-prone. This paper introduces an innovative optical technique that eliminates physical adjustments, thus reducing risk, cost and complexity in AR waveguide metrology referencing. We demonstrate that this new optical method provides referencing equal to the classical mechanical approach. This innovative technique has the potential to significantly simplify AR waveguide metrology, providing a cost-effective and risk-reduced method for quality control metrology.
We present a method to rapidly and accurately measure the eye box of Augmented Reality (AR) and Virtual Reality (VR) eyewear. We demonstrate that this rapid method measures the eye box with a fidelity comparable to slower, traditional methods. The presented rapid method uses a lens that mimics the human eye in core aspects like pupil position, pupil size and field of view to get an impression of the eyewear performance as it appears to a human user with single image capture. By combining as few as three such image captures with such a lens, one can rapidly and accurately measure the entire eye box geometry of any given AR or VR eyewear. We further demonstrate the advantages of adopting this new method by referencing the display metrology industry, where this method has already been adopted as the new metrology standard.
An immersive augmented reality experience requires adapting the display/optical engine to the human visual system, which introduces many measurement and testing challenges. Near-eye displays often use waveguide combiners to produce superior image quality, thereby placing special demands on the metrology needs. Hence, this challenging application requires robust and state-of-the-art mechanics, and optical setup. In this study, an optical metrology system that can perform various image quality analyses on diced (eyepieces) and undiced (wafer level) waveguides is described. Our novel optical metrology system consists of a human-eye mimicking optical setup, and a multi-axis highly accurate robotics.
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