Théo Lahaye
at MC2 Technologies
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 23 April 2020 Paper
Ettien Kpré, Nicolas Vellas, Christophe Gaquiere, Alexandre Martins, Michael Dons, Matthieu Egret, Matthieu Werquin, Sylvain Jonniau, Théo Lahaye
Proceedings Volume 11411, 114110I (2020) https://doi.org/10.1117/12.2558070
KEYWORDS: Metals, Imaging systems, Extremely high frequency, Sensors, Patents, Radiometry, Reflectivity, Calibration, Video, Electromagnetic radiation

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