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Tom M. Godin
Precision Optics Manager at Satisloh North America Inc
SPIE Involvement:
Author
Publications (3)
Proceedings Article | 15 October 2013 Paper
Refractive index of thin films realized by Satisloh SP reactive sputtering system
Gianni Monaco, Arturo Colautti, Cristina Allegro, Tom Godin, Steffan Gold, Michael Witzany
Proceedings Volume 8884, 88841B (2013) https://doi.org/10.1117/12.2030474
KEYWORDS: Refractive index, Sputter deposition, Argon, Silicon, Thin films, Quantum wells, Coating, Oxygen, Nitrogen, Ions
Proceedings Article | 15 October 2013 Paper
SP-100 the fast and reliable machine for coating application in precision optics
Gianni Monaco, Marc Peter, Arturo Colautti, Tom Godin, Steffan Gold, Michael Witzany, Frank Breme
Proceedings Volume 8884, 888419 (2013) https://doi.org/10.1117/12.2028671
KEYWORDS: Coating, Sputter deposition, Reflectivity, Refractive index, Antireflective coatings, Precision optics, Lenses, Glasses, Visible radiation, Silicon
Proceedings Article | 15 October 2013 Paper
Deterministic polishing process for aspheric lenses in a production environment
G. Stach, F. Schwalb
Proceedings Volume 8884, 88840G (2013) https://doi.org/10.1117/12.2028574
KEYWORDS: Polishing, Aspheric lenses, Surface finishing, Manufacturing, Lens grinding equipment, Lenses, Metrology, Polishing equipment, Kinematics, Lens grinding
Conference Committee Involvement (9)
Optifab 2019
14 October 2019 | Rochester, New York, United States
Optifab 2017
16 October 2017 | Rochester, New York, United States
Optifab 2015
12 October 2015 | Rochester, New York, United States
Optifab 2013
14 October 2013 | Rochester, New York, United States
Optifab
9 May 2011 | Rochester, New York, United States
Showing 5 of 9 Conference Committees
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