Dr. Tomasz Sochacki
at Institute of High Pressure Physics
SPIE Involvement:
Author
Publications (16)

Proceedings Article | 9 March 2024 Presentation
Proceedings Volume PC12886, PC128860X (2024) https://doi.org/10.1117/12.3001341
KEYWORDS: Fabrication, Refractive index, Electrochemical etching, Diffraction gratings, Silicon, Ion channels, Gallium nitride, Annealing, Semiconductor lasers, Optical lithography

Proceedings Article | 21 March 2023 Presentation
Malgorzata Iwinska, Tomasz Sochacki, Robert Kucharski, Michal Bockowski
Proceedings Volume PC12421, (2023) https://doi.org/10.1117/12.2649109
KEYWORDS: Gallium nitride, Crystals, Semiconducting wafers, Vapor phase epitaxy, Oxides

Proceedings Article | 21 March 2023 Presentation
Lutz Kirste, Thu Nhi Tran Thi Caliste, José Baruchel, Tomasz Sochacki, Robert Kucharski, Malgorzata Iwinska, Michal Bockowski
Proceedings Volume PC12421, (2023) https://doi.org/10.1117/12.2649878
KEYWORDS: X-rays, Gallium nitride, X-ray diffraction, Diffraction, Crystals, X-ray imaging, Synchrotrons, Synchrotron x-ray imaging, Image processing, Absorption

Proceedings Article | 21 March 2023 Presentation
Kacper Sierakowski, Rafal Jakiela, Tomasz Sochacki, Malgorzata Iwinska, Piotr Jaroszynski, Michal Fijalkowski, Marcin Turek, Michal Bockowski
Proceedings Volume PC12421, (2023) https://doi.org/10.1117/12.2648256
KEYWORDS: Gallium nitride, Ion implantation, Crystals, Diffusion, Annealing, Zinc, Transistors, Optoelectronic devices, Mass spectrometry, Magnesium

Proceedings Article | 5 March 2022 Presentation
Mikolaj Amilusik, Marcin Zajac, Tomasz Sochacki, Boleslaw Lucznik, Michal Fijalkowski, Malgorzata Iwinska, Damian Wlodarczyk, Ajeesh Somakumar, Andrzej Suchocki, Michal Bockowski
Proceedings Volume PC12001, PC1200102 (2022) https://doi.org/10.1117/12.2607476
KEYWORDS: Crystals, Manganese, Carbon, Gallium nitride, Remote sensing, X-ray diffraction, Vapor phase epitaxy, Silicon, Raman spectroscopy, Oxygen

Showing 5 of 16 publications
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