Mr. Uwe Schuhmann Profile

Uwe Schuhmann

Diplom Wirtschaftsingenieur at USC Uwe Schuhmann Consulting

SPIE Involvement:

Author

Publications (9)

Proceedings Article | 18 December 2012 Paper

Improving laser material processing objective lenses towards better utilization of high brilliance light sources

Lutz Reichmann, Hans-Jürgen Feige, Jürgen Finster, Matthias Bening, Jörg Wunderlich, Peter Triebel, Helmut Bernitzki, Uwe Schuhmann

Proceedings Volume 8550, 85500I (2012) https://doi.org/10.1117/12.981341

KEYWORDS: Absorption, Coating, Thermal effects, Finite element methods, Objectives, Lenses, Glasses, Silica, Laser processing, Refractive index

Read Abstract +

Proceedings Article | 25 September 2008 Paper

Low-loss HR coatings on fused silica substrates for 193 nm micro-lithography applications

Sven Laux, Helmut Bernitzki, Dieter Fasold, Michael Klaus, Uwe Schuhmann

Proceedings Volume 7101, 71010Y (2008) https://doi.org/10.1117/12.797820

KEYWORDS: Optical coatings, Reflectivity, Silica, Absorption, Oxides, Laser applications, Light scattering, Multilayers, Excimer lasers, Metals

Read Abstract +

Proceedings Article | 30 May 2003 Paper

Results of a round-robin experiment on reflectivity measurments at a wavelength of 1.06 micron

Detlef Nickel, Christoph Fleig, Andrea Erhard, Andreas Letsch, Adolf Giesen, Marco Jupe, Kai Starke, Detlev Ristau, Oswald Wilhelm, Rudolf Huber, Rainer Haspel, Uwe Schuhmann, Chris Scharfenorth, Hans Joachim Eichler, Stefan Gliech, Angela Duparre, Michael Schulz-Grosser, Anna Krasilnikova, Alexandra Haise, Wolfgang Riede, Ona Balachninaite, Rimantas Grigonis, Valdas Sirutkaitis, Vladimir Kazakevich

Proceedings Volume 4932, (2003) https://doi.org/10.1117/12.472005

KEYWORDS: Reflectivity, Laser optics, Laser induced damage, Digital video discs, Laser therapeutics, Transmittance, Laser components, Spectrophotometry, Dielectric mirrors

Read Abstract +

Proceedings Article | 6 September 1999 Paper

SLIOS: a contribution to standard procedures in stray light measurements

Stefan Baumer, Angela Duparre, Thomas Herrmann, Uwe Schumann, Kees Smorenburg, Volker Kirschner, Lars Mattsson, Teresita Quinteros, Richard Berglind, Stefan Schippel

Proceedings Volume 3739, (1999) https://doi.org/10.1117/12.360173

KEYWORDS: Bidirectional reflectance transmission function, Standards development, Optical testing, Scatter measurement, Mirrors, Stray light, Light scattering, Scattering, Calibration, Data modeling

Read Abstract +

Proceedings Article | 6 September 1999 Paper

International round-robin experiment on optical total scattering at 633 nm according to ISO/DIS 13696

Puja Kadkhoda, Claude Amra, Jean Bennett, Carole Deumie, Angela Duparre, Stefan Gliech, Christian Jolie, Helmut Kessler, Hans Lauth, Tomas Lindstroem, A. Mueller, Norbert Reng, Carl-Gustaf Ribbing, Detlev Ristau, Rainer Schuhmann, Uwe Schuhmann, Markus Tilsch

Proceedings Volume 3739, (1999) https://doi.org/10.1117/12.360187

KEYWORDS: Scattering, Laser scattering, Scatter measurement, Optical spheres, Standards development, Optical components, Laser systems engineering, Laser applications, Inspection, Laser development

Read Abstract +

Proceedings Article | 19 August 1996 Paper

Analysis of interface and volume inhomogeneities in a multilayer system by light scattering methods

Stephan Pichlmaier, Karl Hehl, Uwe Schuhmann, Stefan Gliech, Angela Duparre

Proceedings Volume 2775, (1996) https://doi.org/10.1117/12.246757

KEYWORDS: Scattering, Light scattering, Interfaces, Polarization, Atomic force microscope, Correlation function, Laser scattering, Atomic force microscopy, Coating, Multilayers

Read Abstract +

Proceedings Article | 4 November 1994 Paper

Interface and volume inhomegeneities in optical thin films investigated by light scattering methods

Angela Duparre, Stefan Gliech, Karl Hehl, Stephan Pichlmaier, Uwe Schuhmann

Proceedings Volume 2253, (1994) https://doi.org/10.1117/12.192050

KEYWORDS: Light scattering, Scattering, Interfaces, Polishing, Scatter measurement, Atomic force microscopy, Thin films, Magnesium fluoride, Glasses, Spatial frequencies

Read Abstract +

Proceedings Article | 7 September 1994 Paper

Roughness and scattering measurements on thin films for UV/VIS applications

Angela Duparre, Axel Kiesel, Norbert Kaiser, Horst Truckenbrodt, Uwe Schuhmann

Proceedings Volume 2262, (1994) https://doi.org/10.1117/12.185778

KEYWORDS: Scattering, Polishing, Atomic force microscopy, Magnesium fluoride, Thin films, Light scattering, Surface finishing, Coating, Scatter measurement, Neodymium

Read Abstract +

Proceedings Article | 1 January 1993 Paper

Roughness and defect characterization of optical surfaces by light-scattering measurements

Horst Truckenbrodt, Angela Duparre, Uwe Schuhmann

Proceedings Volume 1781, (1993) https://doi.org/10.1117/12.141001

KEYWORDS: Scattering, Light scattering, Optical testing, Laser scattering, Scatter measurement, Anisotropy, Measurement devices, Particles, 3D metrology, Sensors

Read Abstract +

Showing 5 of 9 publications

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years