Mr. Vimal Thilak Profile

Vimal Thilak

at New Mexico State Univ

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Author

Publications (5)

Proceedings Article | 1 April 2008 Paper

Estimation of target geometry from Mueller matrix imagery

Vimal Thilak, Qingsong Wang, David Voelz, Charles Creusere

Proceedings Volume 6972, 69720S (2008) https://doi.org/10.1117/12.780366

KEYWORDS: Bidirectional reflectance transmission function, Polarimetry, Scattering, Polarization, Target detection, Reflection, Remote sensing, Complex systems, Reflectivity, Refraction

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Proceedings Article | 18 October 2007 Paper

Image segmentation from multi-look passive polarimetric imagery

Vimal Thilak, David Voelz, Charles Creusere

Proceedings Volume 6682, 668206 (2007) https://doi.org/10.1117/12.731503

KEYWORDS: Image segmentation, Polarimetry, Polarization, Refraction, Bidirectional reflectance transmission function, Detection and tracking algorithms, Cameras, Image processing algorithms and systems, Reflection, Aluminum

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Proceedings Article | 13 September 2007 Paper

Estimation of incidence and reflection angles from passive polarimetric imagery: extension to out-of-plane scattering

Anand Pamba, Vimal Thilak, David Voelz, Charles Creusere

Proceedings Volume 6682, 66820O (2007) https://doi.org/10.1117/12.732649

KEYWORDS: Scattering, Polarimetry, Polarization, Bidirectional reflectance transmission function, Refraction, Reflection, Receivers, Light scattering, Refractive index, Remote sensing

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Proceedings Article | 3 May 2006 Paper

Estimating the refractive index and reflected zenith angle of a target using multiple polarization measurements

Vimal Thilak, David Voelz, Charles Creusere, Srikanth Damarla

Proceedings Volume 6240, 624004 (2006) https://doi.org/10.1117/12.666183

KEYWORDS: Refractive index, Polarimetry, Polarization, Scattering, Bidirectional reflectance transmission function, Dielectric polarization, Reflectivity, Computer simulations, Remote sensing, Cameras

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Proceedings Article | 18 August 2005 Paper

Pattern recognition for passive polarimetric data using nonparametric classifiers

Vimal Thilak, Jatinder Saini, David Voelz, Charles Creusere

Proceedings Volume 5888, 588816 (2005) https://doi.org/10.1117/12.618980

KEYWORDS: Polarization, Polarimetry, Probability theory, Pattern recognition, Imaging systems, Detection and tracking algorithms, Neural networks, Liquid crystals, Calibration, Machine vision

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