Vladimir V. Losev
at Moscow Inst of Electronic Tech
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 31 January 2022 Paper
Proceedings Volume 12157, 121571N (2022) https://doi.org/10.1117/12.2623146
KEYWORDS: Transistors, Capacitance, Network security, Field effect transistors, Analytical research, Reflectometry, Signal analysis, Gallium arsenide, Medium wave, Roentgenium

Proceedings Article | 28 May 2004 Paper
Vladimir Losev, Victor Staroselsky
Proceedings Volume 5401, (2004) https://doi.org/10.1117/12.562669

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