Dr. Volker Tympel
Department Head
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Publications (4)

Proceedings Article | 18 June 2007 Paper
Volker Tympel, Marko Schaaf, Bernd Srocka
Proceedings Volume 6616, 66161D (2007) https://doi.org/10.1117/12.725772
KEYWORDS: Defect detection, Inspection, Particles, Microscopy, Optical microscopy, Microscopes, Semiconducting wafers, Image filtering, Objectives, 3D image processing

Proceedings Article | 2 June 2003 Paper
Volker Tympel, Roberto Witt, Shannon Layland
Proceedings Volume 5038, (2003) https://doi.org/10.1117/12.482639
KEYWORDS: Image processing, Distributed computing, Microscopes, Objectives, Cameras, Image enhancement, Wafer-level optics, Human-machine interfaces, Semiconducting wafers, Image contrast enhancement

Proceedings Article | 10 April 1997 Paper
Proceedings Volume 2984, (1997) https://doi.org/10.1117/12.271267
KEYWORDS: Microscopy, Video, Microscopes, Computing systems, Image resolution, Cameras, Frame grabbers, 3D image processing, Image processing, Luminescence

Proceedings Article | 15 April 1996 Paper
Proceedings Volume 2707, (1996) https://doi.org/10.1117/12.238483
KEYWORDS: Microscopy, Microscopes, Video, Computing systems, Confocal microscopy, Cameras, Image processing, Objectives, Frame grabbers, Image enhancement

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