Dr. Walter J. Scheirer Profile

Dr. Walter J. Scheirer

Associate Professor at Univ of Notre Dame

SPIE Involvement:

Author | Editor

Publications (5)

Proceedings Article | 7 June 2024 Presentation + Paper

Multi-objective optimization with homotopy-based strategies for enhanced multimodal automatic target recognition models

Sophia Abraham, Steve Cruz, Suya You, Jonathan Hauenstein, Walter Scheirer

Proceedings Volume 13039, 1303903 (2024) https://doi.org/10.1117/12.3012394

KEYWORDS: Education and training, Automatic target recognition, Data modeling, Visual process modeling, Visualization, Machine learning, Performance modeling, Mathematical optimization, Semantics, Target recognition

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Proceedings Article | 13 June 2023 Presentation + Paper

Efficient hyperparameter optimization for ATR using homotopy parametrization

Sophia Abraham, Jeffrey Kinnison, Zachary Miksis, Domenick Poster, Suya You, Jonathan Hauenstein, Walter Scheirer

Proceedings Volume 12521, 1252107 (2023) https://doi.org/10.1117/12.2662753

KEYWORDS: Object detection, Data modeling, Automatic target recognition, Mathematical optimization, Detection and tracking algorithms, Performance modeling, Visual process modeling, Target detection, Overfitting

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Proceedings Article | 31 May 2013 Paper

Secure voice-based authentication for mobile devices: vaulted voice verification

R. C. Johnson, Walter Scheirer, Terrance Boult

Proceedings Volume 8712, 87120P (2013) https://doi.org/10.1117/12.2015649

KEYWORDS: Biometrics, Computer security, Data modeling, Mobile devices, Binary data, Cell phones, Information security, Instrument modeling, Iris, Statistical modeling

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Proceedings Article | 31 May 2013 Paper

How reliable are your visual attributes?

W. Scheirer, N. Kumar, V. Iyer, P. Belhumeur, T. Boult

Proceedings Volume 8712, 87120Q (2013) https://doi.org/10.1117/12.2018974

KEYWORDS: Reliability, Visualization, Image quality, Data modeling, Facial recognition systems, Statistical modeling, Binary data, Image processing, Image retrieval, Nose

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Proceedings Article | 17 March 2008 Paper

FAAD: face at a distance

Terrance Boult, Walter Scheirer, R. Woodworth

Proceedings Volume 6944, 694402 (2008) https://doi.org/10.1117/12.781497

KEYWORDS: Facial recognition systems, Sensors, Biometrics, Directed energy weapons, Lead, Optical resolution, Light sources and illumination, Failure analysis

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