Mr. Wei-Pin Ernest Lau Profile

Wei-Pin Ernest Lau

at DSO National Labs

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 6 March 2013 Paper

Multi-kW high brightness Yb:YAG thin disk laser

Y. Peng, Y. Lim, James Cheng, Y. Tan, Ernest Lau, K. Lai

Proceedings Volume 8599, 85991B (2013) https://doi.org/10.1117/12.2003574

KEYWORDS: Disk lasers, Mirrors, Resonators, Laser resonators, Laser development, Thermal effects, Reflectivity, Optical components, Modes of laser operation, Adaptive optics

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Proceedings Article | 29 October 2001 Paper

Thermal investigation of a 120-W Tm:YAG laser

Wenjie Xie, Kin Seng Lai, Yuan Lim, Ruifen Wu, Ernest Lau, Hui Wong

Proceedings Volume 4595, (2001) https://doi.org/10.1117/12.446596

KEYWORDS: Rod lasers, Compound parabolic concentrators, Diodes, Distortion, Optical pumping, Laser resonators, Temperature metrology, Lithium, Semiconductor lasers, Cameras

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Proceedings Article | 29 October 2001 Paper

Compact mid-IR intracavity OPO

Ruifen Wu, Kin Seng Lai, Hui Wong, Wenjie Xie, Yuan Lim, Ernest Lau

Proceedings Volume 4595, (2001) https://doi.org/10.1117/12.446628

KEYWORDS: Optical parametric oscillators, Mirrors, Neodymium, Crystals, Semiconductor lasers, Q switched lasers, Output couplers, Mid-IR, Laser crystals, Laser resonators

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Proceedings Article | 29 October 2001 Paper

High-power diffusion-bonded walk-off-compensated KTP OPO

Ruifen Wu, Kin Seng Lai, Hui Wong, Ernest Lau, Yuan Lim, Wenjie Xie

Proceedings Volume 4595, (2001) https://doi.org/10.1117/12.446600

KEYWORDS: Optical parametric oscillators, Ferroelectric materials, Crystals, Neodymium, Nonlinear crystals, Laser crystals, Laser resonators, Mirrors, Diffusion, Diodes

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Proceedings Article | 9 November 1999 Paper

Comparative investigation of high-resolution transmission electron microscopy and Fourier transform infrared spectroscopy for GaN films on sapphire substrate

Kun Li, Yong Hou, Zhe Chuan Feng, Soo-Jin Chua, Ming Fu Li, Ernest Lau, Andrew Wee

Proceedings Volume 3899, (1999) https://doi.org/10.1117/12.369444

KEYWORDS: Gallium nitride, Transmission electron microscopy, Reflectivity, Interfaces, Sapphire, FT-IR spectroscopy, Atomic force microscopy, Silicon, Diffraction, Infrared radiation

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