Dr. Wei Chu Profile

Dr. Wei Chu

at National Institute of Standards and Technology

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Author

Publications (6)

Proceedings Article | 10 June 2010 Paper

Topography measurements for correlations of standard cartridge cases

T. Vorburger, J. Song, W. Chu, T. Renegar, A. Zheng, J. Yen, R. Thompson, R. Silver, B. Bachrach, M. Ols

Proceedings Volume 7729, 77291D (2010) https://doi.org/10.1117/12.859918

KEYWORDS: Standards development, Objectives, Confocal microscopy, Firearms, Microscopes, Optical imaging, Image acquisition, Optical microscopes, Databases, Imaging systems

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Proceedings Article | 3 June 2010 Paper

Optimal compression and binarization of signature profiles for automated bullet identification systems

Wei Chu, John Song, Theodore Vorburger, Robert Thompson, Thomas Renegar, Richard Silver

Proceedings Volume 7729, 77291C (2010) https://doi.org/10.1117/12.859858

KEYWORDS: Edge detection, Image processing, System identification, Firearms, Binary data, Microscopes, Manufacturing, Forensic science, Image compression, Sensors

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Proceedings Article | 5 April 2007 Paper

An approach to modeling and on-line identification for piezoelectric stack actuator

Yueyu Wang, Xuezeng Zhao, Wei Chu

Proceedings Volume 6518, 65184J (2007) https://doi.org/10.1117/12.711851

KEYWORDS: Actuators, Scanning probe microscopy, Scanners, Data modeling, Sensors, Systems modeling, Statistical modeling, Scanning probe microscopes, Distortion, Scanning tunneling microscopy

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Proceedings Article | 23 February 2006 Paper

Application of cellular neural networks in the measurement of line-width and line edge roughness

Hong-bo Li, Xue-zheng Zhao, Wei Chu, Ning Li

Proceedings Volume 6150, 61504S (2006) https://doi.org/10.1117/12.676727

KEYWORDS: Line edge roughness, Line width roughness, Neural networks, Atomic force microscopy, Edge detection, Image processing, Lithium, Data processing, Edge roughness, Binary data

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Proceedings Article | 20 August 2004 Paper

Study of an image stitching method for linewidth measurement

Wei Chu, Xuezeng Zhao, Joseph Fu, Theodore Vorburger

Proceedings Volume 5446, (2004) https://doi.org/10.1117/12.557767

KEYWORDS: Image registration, Atomic force microscopy, Carbon nanotubes, Distortion, Image fusion, 3D image processing, Standards development, Error analysis, Metrology, Electrical engineering

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Proceedings Article | 24 May 2004 Paper

An image stitching method to eliminate the distortion of the sidewall in linewidth measurement

Xuezeng Zhao, Joseph Fu, Wei Chu, Cattien Nguyen, Theodore Vorburger

Proceedings Volume 5375, (2004) https://doi.org/10.1117/12.536692

KEYWORDS: Atomic force microscopy, Image registration, Distortion, Carbon nanotubes, Scanning electron microscopy, Standards development, Semiconductor manufacturing, Data storage, Crystals, Oxides

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Showing 5 of 6 publications

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