Mr. Wei Li Profile

Wei Li

at Nanyang Technological Univ

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 27 February 2019 Paper

Bong Kwon Son, Yiding Lin, Wei Li, Kwang Hong Lee, Joe Margetis, David Kohen, John Tolle, Lin Zhang, Tina Guo Xin, Hong Wang, Chuan Seng Tan

Proceedings Volume 10914, 109141A (2019) https://doi.org/10.1117/12.2506355

KEYWORDS: Silicon, Germanium, Photodetectors, Tin, Signal to noise ratio, Absorption, Semiconducting wafers, Raman spectroscopy

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