Mr. Wei Ma Profile

Wei Ma

at Luoyang Optoelectro Technology Development Ctr

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Proceedings Article | 12 March 2021 Paper

Review of reliability research on infrared detector

Yang Wang, Chao Meng, Wei Ma

Proceedings Volume 11763, 117630R (2021) https://doi.org/10.1117/12.2585900

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The development of domestic and foreign reliability research on infrared detector is introduced. Many IDDCA manufacturers have their own reliability assurance systems to obtain high reliability in the developing and manufacturing process. According to the characteristics and workings of infrared detector, the failure mechanism and accelerating test is analyzed. Then the design is optimized constantly, reliability is improved, and the model of reliability is built.

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