CdS is deposited on transparent conductive oxide (TCO)-coated glass substrate by radio frequency (r.f.) magnetron
sputtering method. The X-ray diffraction (XRD) measurements revealed that CdS films were polycrystalline with the
hexagonal wurtzite structure present only. The same conclusions as described below are arrived at from the
photoluminescence (PL) and UV-vis absorption spectra measurements. When the power increases or the gas pressure
decreases, the grain size and the film thickness increases, and then lead to the increase of stress in films which results in
the decrease of energy band gap. The substrate temperature also has an effect on the strain in the films.
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