Camera calibration is an important component of stereo digital image correlation (DIC) measurements. However, traditional calibration images suffer from insufficient information and blurriness during corner detection at low resolutions, which limit the precision of calibration and measurement. To address this issue, a super-resolution corner detection method based on attention mechanism is proposed in this paper. The proposed method enhances the focus on the high-frequency information of calibration corners using attention mechanism, thereby enabling the reconstruction of low-resolution images to improve the accuracy of corner detection during calibration, thus enhancing the quality of camera calibration. Experimental results on DIC camera calibration reveal that the proposed corner detection method exhibits smaller reprojection errors. Furthermore, the calibration results using this method can improve the geometric reconstruction accuracy of DIC.
We propose an ex-situ reposition error compensation method to solve the reposition error in the ex-situ state of 2D digital image correlation (2D-DIC) in the long-term deformation of the measurement specimen or under special load deformation. Using the dual-reflector auxiliary measurement system with an included angle of 90 deg, the two sides of the repositioned specimen are mapped into left and right mirrors. The in- and out-of-plane rigid body displacements are compensated via the error compensation method, and the real in-plane displacement of the tested specimen is obtained. The accuracy and practicability of this method are verified by conducting an in-plane rigid body displacement experiment, unloaded specimen reposition experiment, thermal deformation experiment, and finite element analysis. We provide a simple, effective, and high-precision deformation measurement method for 2D-DIC to realize ex-situ measurement.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.