Ms. Wiebke Ehrig Profile

Wiebke Ehrig

at Physikalisch-Technische Bundesanstalt

SPIE Involvement:

Author

Publications (3)

Proceedings Article | 19 January 2009 Paper

Traceable optical coordinate metrology applications for the micro range

Wiebke Ehrig, Ulrich Neuschaefer-Rube, Michael Neugebauer, Rudolf Meeß

Proceedings Volume 7239, 72390G (2009) https://doi.org/10.1117/12.810215

KEYWORDS: Sensors, Standards development, Optical sensors, Optical spheres, Scattering, Calibration, Metrology, Interferometers, Light scattering, Optical testing

Read Abstract +

Proceedings Article | 12 January 2009 Paper

Test procedures and artefacts for optical coordinate metrology

Ulrich Neuschaefer-Rube, Wiebke Ehrig, Michael Neugebauer, Klaus Wendt

Proceedings Volume 7133, 713304 (2009) https://doi.org/10.1117/12.810474

Read Abstract +

Proceedings Article | 18 June 2007 Paper

Artefacts with rough surfaces for verification of optical microsensors

Wiebke Ehrig, Ulrich Neuschaefer-Rube

Proceedings Volume 6616, 661626 (2007) https://doi.org/10.1117/12.725976

KEYWORDS: Sensors, Scattering, Optical sensors, Light scattering, Standards development, Calibration, Optical testing, Microsensors, Metrology, Manufacturing

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years