Dr. Wojtek J. Walecki
at Optoprofiler LLC
SPIE Involvement:
Author
Area of Expertise:
interferometry , metrology , oct , semiconductors , microscopy , lasers
Websites:
Profile Summary

Wojtek Walecki received his Ph.D. in Physics and his Master's in Engineering from Brown University in 1994 and 1992 respectively, and a Masters in Physics from Warsaw University in 1988. He did his postdoctoral research at Cornell University. His academic interests were focused on ultrafast spectroscopy of semiconductors and semiconducting devices from UV to THz spectral range. Later Wojtek worked as Semiconductor Diagnostics Program Manager, Product Manager, Worldwide Product Manager, and Division Manager in several companies including ThermoOriel, Lambda Physik, Frontier Semiconductor, and until the fall of 2016, Sunrise Optical LLC. In August 2016, Wojtek returned to Frontier Semiconductor, this time as Chief Technology Officer. Later he left Frontier Semiconductors and created Optoprofiler LLC He is the author of about 80 publications, and 25 granted US Patents.
Publications (31)

Proceedings Article | 4 October 2023 Presentation + Paper
Proceedings Volume 12672, 126720P (2023) https://doi.org/10.1117/12.2677100
KEYWORDS: Spectrometers, Calibration, Optical coherence tomography, Semiconducting wafers, Wafer-level optics, Singular optics, Single mode fibers, Optical fibers, Reflection, Michelson interferometers

Proceedings Article | 3 October 2023 Presentation + Paper
Proceedings Volume 12695, 1269509 (2023) https://doi.org/10.1117/12.3000238
KEYWORDS: Detector arrays, Wafer-level optics, Displays, Error analysis, Sensors, Mirrors, Cameras, Semiconducting wafers, Optical gratings, Metrology

Proceedings Article | 16 June 2023 Poster + Paper
Proceedings Volume 12524, 125240K (2023) https://doi.org/10.1117/12.2663267
KEYWORDS: Metrology, Packaging, Imaging systems, Structured light, Solar cells, Semiconductors, Projection systems, Heatsinks, Cameras, Tomography

Proceedings Article | 16 June 2023 Presentation + Paper
Proceedings Volume 12524, 125240A (2023) https://doi.org/10.1117/12.2661304
KEYWORDS: Metrology, Semiconducting wafers, Semiconductors, Packaging, Spectroscopy, Scatterometry, Scattering, Ray tracing, Radar, Prisms

Proceedings Article | 15 June 2023 Presentation + Paper
Proceedings Volume 12516, 125160I (2023) https://doi.org/10.1117/12.2660668
KEYWORDS: Spectroscopy, Semiconducting wafers, Optical coherence tomography, Semiconductors, Metrology, Calibration, Fiber optics, Detector arrays, Single mode fibers, Michelson interferometers

Showing 5 of 31 publications
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