Dr. Wolfgang Mertin
at Univ Duisburg-Essen
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 13 March 2024 Presentation
Proceedings Volume PC12906, PC129060D (2024) https://doi.org/10.1117/12.2692824
KEYWORDS: Graphene, Light emitting diodes, Ultraviolet radiation, 2D materials, Visible radiation, Copper, Chemical vapor deposition, Transparency, Semiconducting wafers, Optical properties

Proceedings Article | 16 February 2009 Paper
André Lochthofen, Wolfgang Mertin, Gerd Bacher, Lutz Hoeppel, Stefan Bader, Jürgen Off, Berthold Hahn
Proceedings Volume 7216, 721610 (2009) https://doi.org/10.1117/12.808992
KEYWORDS: Gallium nitride, Atomic force microscopy, Doping, Temperature metrology, Heterojunctions, Scanning transmission electron microscopy, Interfaces, Microscopy, Oxides, Image transmission

Proceedings Article | 8 February 2007 Paper
Proceedings Volume 6473, 64730Z (2007) https://doi.org/10.1117/12.704855
KEYWORDS: Diodes, Semiconductor lasers, Microscopy, Heterojunctions, Gallium nitride, Mirrors, Electroluminescence, Gold, Silicon carbide, Magnesium

Proceedings Article | 22 February 2006 Paper
Proceedings Volume 6134, 61340I (2006) https://doi.org/10.1117/12.645768
KEYWORDS: Diodes, Light emitting diodes, Modulation, Microscopy, Aluminium gallium indium phosphide, Spatial resolution, Interfaces, Heterojunctions, Semiconductors, Gallium

Proceedings Article | 15 April 1997 Paper
Michael Stopka, Stefan Muenster, T. Leinhos, Christopher Mihalcea, Wenzel Scholz, A. Leyk, W. Mertin, Egbert Oesterschulze
Proceedings Volume 3009, (1997) https://doi.org/10.1117/12.271217
KEYWORDS: Silicon, Waveguides, Diodes, Atomic force microscopy, Semiconducting wafers, Oxides, Microscopy, Near field scanning optical microscopy, Aluminum, Scanning electron microscopy

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