Dr. Wu-sheng Shih Profile

Dr. Wu-sheng Shih

Project Manager at Brewer Science Inc

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 19 September 2011 Paper

All-printed CNT transistors with high on-off ratio and bias-invariant transconductance

Guiru Gu, Yunfeng Ling, Runyu Liu, Puminun Vasinajindakaw, Xuejun Lu, Carissa Jones, Wu-Sheng Shih, Vijaya Kayastha, Nick Downing, Urs Berger, Mike Renn

Proceedings Volume 8101, 81010B (2011) https://doi.org/10.1117/12.894472

KEYWORDS: Transistors, Carbon nanotubes, Electrodes, Thin films, Flexible circuits, Semiconductors, Dielectrics, Applied physics, Polymers, Solid state electronics

Read Abstract +

Proceedings Article | 1 May 2008 Paper

High-speed transparent flexible electronics

Jarrod Vaillancourt, Xuejun Lu, Xuliang Han, Daniel Janzen, Wu-Sheng Shih

Proceedings Volume 6940, 69403A (2008) https://doi.org/10.1117/12.777348

KEYWORDS: Flexible circuits, Transparency, Transistors, Thin films, Modulation, Resistance, Electronic circuits, Printing, Carbon nanotubes, Electrodes

Read Abstract +

Proceedings Article | 15 February 2006 Paper

Press-patterned UV-curable high refractive index coatings

Robert Morford, Wu-Sheng Shih, JoElle Dachsteiner

Proceedings Volume 6123, 612301 (2006) https://doi.org/10.1117/12.643164

KEYWORDS: Semiconducting wafers, Refractive index, Ultraviolet radiation, Scanning electron microscopy, Organic materials, Optical components, Optical coatings, Quartz, Prisms, Silicon

Read Abstract +

Proceedings Article | 31 March 2005 Paper

Press-patterned diffraction gratings on high refractive index polyimide films

Ramil Mercado, Rebecca Rich, Wu-Sheng Shih, Udayan Senapati, Doug Holmes

Proceedings Volume 5728, (2005) https://doi.org/10.1117/12.590515

KEYWORDS: Polymers, Refractive index, Semiconducting wafers, Diffraction gratings, Optical lithography, Glasses, Photonics, Wafer-level optics, Silicon, Wafer testing

Read Abstract +

Proceedings Article | 14 May 2004 Paper

A planarization process for multi-layer lithography applications

Wu-Sheng Shih, Charles Neef, Mark Daffron

Proceedings Volume 5376, (2004) https://doi.org/10.1117/12.535303

KEYWORDS: Semiconducting wafers, Optical lithography, Lithography, Scanning electron microscopy, Image processing, Photoresist materials, Plasma etching, Chemical mechanical planarization, Coating, Materials processing

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years