Innovations in optics, focal plane arrays (FPA), microelectronics and image processing have revolutionized infrared camera design. Infrared detectors coupled with nanostructures are expected to subvert the traditional intensity detectors and advance to the multi-dimensional and data cube detectors. Photon trapping technology is expected to decrease the intrinsic dark current, broaden the response band, increase the QE and increase the working temperature. High density FPAs result to novel wide field-of-view small SWaP broadband infrared camera architecture. Digital-pixel focal plane for real-time digital image processing enable the intelligent chips. This paper highlights sensors with nanostructure coupled FPA, photo trapping FPAs, high density FPAs and digital-pixel FPAs.
Begin with the most pressing general questions base on the major surveys of astronomy and astrophysics today, the paper introduce the mission of deep space infrared detection, and the main requirements for infrared detectors, then introduce the principles and performance of cutting edge infrared detectors, readout integrated circuit and Application Specific integrated Circuit (ASIC) for deep space observatory. Base on present state of the infrared detectors, propose advices for developing Chinese infrared Focal Plane Array (FPA) detector for deep space observatory.
Cryogenic camera which is widely used in deep space detection cools down optical system and support structure by cryogenic refrigeration technology, thereby improving the sensitivity. Discussing the characteristics and design points of infrared detector combined with camera’s characteristics. At the same time, cryogenic background test systems of chip and detector assembly are established. Chip test system is based on variable cryogenic and multilayer Dewar, and assembly test system is based on target and background simulator in the thermal vacuum environment. The core of test is to establish cryogenic background. Non-uniformity, ratio of dead pixels and noise of test result are given finally. The establishment of test system supports for the design and calculation of infrared systems.
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