Prof. Yasuhiko Arai
at Kansai Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (56)

SPIE Journal Paper | 20 January 2020
OE, Vol. 59, Issue 01, 014108, (January 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.1.014108
KEYWORDS: 3D metrology, Speckle pattern, Speckle interferometry, Speckle, Diffraction, Objectives, Abrasives, Shape analysis, Scatterometry, Optical engineering

Proceedings Article | 3 September 2019 Paper
Proceedings Volume 11102, 1110203 (2019) https://doi.org/10.1117/12.2528297
KEYWORDS: Light scattering, Diffraction gratings, Diffraction, Electromagnetism, Speckle pattern, Scattering, Speckle interferometry, Electromagnetic scattering, Shape analysis, Objectives

Proceedings Article | 21 June 2019 Presentation + Paper
Proceedings Volume 11056, 110560B (2019) https://doi.org/10.1117/12.2525260
KEYWORDS: Diffraction, Speckle pattern, Objectives, Speckle interferometry, Shape analysis, 3D image processing, Diffraction gratings, Beam shaping, 3D metrology, Fringe analysis

Proceedings Article | 18 August 2018 Presentation + Paper
Proceedings Volume 10749, 1074902 (2018) https://doi.org/10.1117/12.2318040
KEYWORDS: Diffraction gratings, Speckle interferometry, Diffraction, Speckle pattern, Speckle, Atomic force microscopy, 3D metrology, Holography, Interferometers, Objectives

Proceedings Article | 24 April 2018 Paper
Tatsuki Tahara, Shotaro Maruo, Takuya Gotohda, Reo Otani, Yasuhiko Arai, Yasuhiro Takaki
Proceedings Volume 10711, 107110T (2018) https://doi.org/10.1117/12.2318987
KEYWORDS: Phase shifts, Holograms, Digital holography, Phase interferometry, Holography, 3D image processing

Showing 5 of 56 publications
Conference Committee Involvement (22)
Optical Technology and Measurement for Industrial Applications Conference
21 April 2025 | Yokohama, Japan
Optical Technology and Measurement for Industrial Applications Conference
22 April 2024 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications X
15 October 2023 | Beijing, China
Optical Technology and Measurement for Industrial Applications Conference
17 April 2023 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications IX
5 December 2022 | Online Only, China
Showing 5 of 22 Conference Committees
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