Ying Zhang
at China North Vehicle Research Institute
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 29 November 2021 Paper
Proceedings Volume 12080, 120801K (2021) https://doi.org/10.1117/12.2619311
KEYWORDS: Silicon carbide, Thermal modeling, Switching, Field effect transistors, 3D modeling, Finite element methods, Diodes, Data modeling, Copper, Resistance

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top