Ms. Yingqing Chen Profile

Yingqing Chen

at Harbin Institute of Technology

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 17 May 2019 Paper

3-D measurement based on phase-shifting using calibration of light plane

Yingqing Chen, Sining Li, Wei Lu, Zijian Li, Gang Liu

Proceedings Volume 11170, 1117008 (2019) https://doi.org/10.1117/12.2531466

KEYWORDS: Calibration, Phase shifts, Cameras, Imaging systems, Microelectromechanical systems, CCD cameras, 3D metrology, Phase shifting, Fringe analysis

Read Abstract +

Based on the phase-shifting fringe scanning projection technique using MEMS galvanometer, the threedimensional shape measurement of the object can be realized. However, we found that the experimental results were more sensitive to some experimental parameters. To avoid it, we introduced a light plane calibration model in the threedimensional measurement system. This calibration model avoids the physical measurement of some experimental parameters, and at the same time makes the operation more convenient and faster, and improves the stability and operability of the experiment. Through the detection experiment of the plane, the relative root mean square relative error of the obtained result is 9.155mm, which is greatly improved compared with the previous experimental results, but the result is still not ideal. We discuss some factors affecting the accuracy of the system which can be improved in the future. The experiment proved its feasibility and potential, and the Powell prism and MEMS galvanometer selected are small in size. The dimensions of Powell prism and MEMS galvanometer are 9.0mm 8.0mm and 2.5mm 3.0mm respectively. The miniaturization of equipment is very advantageous for achieving integration and maintenance of the device.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years