The monitoring and decommissioning of a nuclear power plant requires an image sensor resistant to gamma-ray irradiation that operates around the reactor. In this study, a single-pixel image sensor consisting of a photodiode (PD) and three-n-channel metal-oxide-semiconductor field-effect transistor (n-MOSFET) was initially prototyped using 4H-SiC complementary metal-oxide-semiconductor (CMOS) technology. The single-pixel circuit responded correctly to the UV lamp being switched on/off, even at 1 MGy. However, the output current (IOUT) of the image sensor increased by 60% at 200 kGy and then remained constant until 1 MGy. This behavior is caused by a shift in the threshold voltage (▵Vth) of the n-MOSFET. A simulation (using LTspice) confirmed that the increased IOUT can be suppressed with a differential circuit that reads out the reference voltage and signal voltage at different timing and outputs the difference in their voltage. Although the differential circuit can suppress the increase of IOUT caused by gamma-ray irradiation, this circuit has its own problem vis-a-vis ▵Vth caused by bias temperature stress. To suppress ▵Vth caused by positive bias temperature instability (PBTI), we proposed a drive method wherein before reading the two voltages, a bias stress is applied for n-MOSFET to saturate ▵Vth. As a result, ▵Vth and its variation can be suppressed. From these results, we expect the single-pixel circuit to function without problems between 0 kGy and 1 MGy using the differential circuit and proposed drive method. The 4H-SiC image sensor could be a promising candidate for a camera with gamma-ray irradiation resistance.
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