The measurement of the polarizations and phase profiles of a light beam in one shot is of crucial importance for fundamental researches and daily life. Recently, optical metasurfaces, the ultrathin inhomogeneous interface made of planner nanostructure arrays, have become multi-functional and compact platforms for various emerging applications. Here, we propose and demonstrate an integrated, ultra-compact and miniaturized optical multi-parameter detector, based on efficient metalens arrays featuring the basic pixel composed of 2×2 polarization-dependent metalenses. This multifunctional detector determines not only the spatially variant polarizations through relative focusing intensities, but also the phase gradient profiles via submicron displacements of focal points. To demonstrate its performance, we experimentally measure the beams of 18 scalar polarizations and 7 tilted wavefronts with our system, showing average relative errors of as low as 3.89% for polarization detections and 3.72% for phase gradient detections. Our work can be applied to polarization imaging, optical element topography diagnosis, complex structure light detection, target recognition and health care.
Measuring light’s information of polarization and phase in real time is very important in optics. Since metasurfaces enable the wavefront manipulation, which can replace some conventional optical components and make the system extremely compact. Here, we apply the concept of metasurface to system level, creating a generalized Hartmann-Shack array based on 3×2 sub-arrays of silicon-based metalenses for optical multi-parameters detection, which not only measures phase and phase-gradient profiles of optical beams but also measures spatial polarization profiles at the same time. The silicon-based metalenses, with a numerical aperture of 0.32 and a mean measured focusing efficiency in transmission mode of 28% at a wavelength of 1550 nm. Furthermore, we demonstrate detections of a radially polarized beam, an azimuthally polarized beam and a vortex beam.
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