Dr. Zoltán Füzessy
Professor Emeritus at Budapest Univ of Technology and Economics
SPIE Involvement:
Author
Publications (22)

SPIE Journal Paper | 1 April 2009
Venczel Borbely, Zoltán Füzessy, Ferenc Gyimesi, Béla Ráczkevi
OE, Vol. 48, Issue 04, 045801, (April 2009) https://doi.org/10.1117/12.10.1117/1.3115468
KEYWORDS: Holography, Holograms, Visibility, Optical filters, Holographic interferometry, Mirrors, Optical engineering, Wave plates, Image filtering, Imaging systems

SPIE Journal Paper | 1 February 2005
Vencel Borbély, Zoltán Füzessy, Ferenc Gyimesi, Béla Ráczkevi
OE, Vol. 44, Issue 02, 023601, (February 2005) https://doi.org/10.1117/12.10.1117/1.1842778
KEYWORDS: Holographic interferometry, Holograms, Mirrors, 3D image reconstruction, Holography, Interferometry, Visualization, Optical engineering, Wave plates, Visibility

Proceedings Article | 10 September 2004 Paper
Proceedings Volume 5457, (2004) https://doi.org/10.1117/12.546707
KEYWORDS: Digital holography, Holograms, Holographic interferometry, Spatial light modulators, 3D image reconstruction, Holography, CCD cameras, Fringe analysis, Phase shifts, Interferometry

Proceedings Article | 10 September 2004 Paper
Ferenc Gyimesi, Zoltan Fuzessy, Bela Raczkevi, Vencel Borbely
Proceedings Volume 5457, (2004) https://doi.org/10.1117/12.546053
KEYWORDS: Mirrors, Holographic interferometry, Holography, Holograms, Digital holography, Interferometry, Wavefronts, Colorimetry, Optical alignment, 3D image reconstruction

Proceedings Article | 10 September 2004 Paper
Zoltan Fuzessy, Ferenc Gyimesi, Janos Kornis, Bela Raczkevi, Vencel Borbely, Balazs Gombkoto
Proceedings Volume 5457, (2004) https://doi.org/10.1117/12.554759
KEYWORDS: Digital holography, Holographic interferometry, Holograms, Charge-coupled devices, Holography, CCD cameras, Digital recording, Cameras, Physics, 3D image reconstruction

Showing 5 of 22 publications
Conference Committee Involvement (2)
Optical Measurement Systems for Industrial Inspection IV
13 June 2005 | Munich, Germany
Optical Measurement Systems for Industrial Inspection III
23 June 2003 | Munich, Germany
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