In this paper, Er-doped ZnO thin films were deposited on the substrates of slide and Si by sol-gel method. The effects of Er concentration on the structure, morphology and optical properties were studied in detail. The Er/Zn ratio were 1%, 2%,3%,All the samples were characterized by X-ray diffraction(XRD),atomic force microscope(AFM), ultra-violet spectrometer(UVS) and photoluminescence(PL). The AFM images illustrated the morphology of samples have uniform distribution and smooth surface, the grain size became smaller as the Er/Zn molar ratio increased. The PL spectra showed two emission bands located in the UV region and the visible region, both the positions and the intensities are affected by Er concentration. As the doping concentration increased, the transmission side had blue shife and the samples gradually increased ultraviolet light. This result was similar to the transmission spectra. The XRD pattern revealed all the samples had a hexagonal wurtzite structure.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.