Ying Zhang
at Sichuan Univ.
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | 5 January 2024
OE, Vol. 63, Issue 01, 014101, (January 2024) https://doi.org/10.1117/12.10.1117/1.OE.63.1.014101
KEYWORDS: Phase unwrapping, Reconstruction algorithms, Reliability, Optical engineering, Shadows, Algorithm development, Phase shifts, Cross validation, Phase measurement, 3D metrology

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