Use Of A Charge-Coupled Device In X-Ray Astronomy As A High-Resolution Imaging Detector With Spectral Resolution

D. A. Schwartz; R. E. Griffiths; S. S. Murray; M. V. Zombeck; W. Bradley

doi:10.1117/12.957458

9 August 1979 Use Of A Charge-Coupled Device In X-Ray Astronomy As A High-Resolution Imaging Detector With Spectral Resolution

D. A. Schwartz, R. E. Griffiths, S. S. Murray, M. V. Zombeck, W. Bradley

Author Affiliations +

Proceedings Volume 0184, Space Optics Imaging X-Ray Optics Workshop; (1979) https://doi.org/10.1117/12.957458
Event: 1979 Huntsville Technical Symposium, 1979, Huntsville, United States

Abstract

Future shuttle launched telescopes for X-ray astronomy will require a wide range of instruments to exploit the potential scientific return. A Charge Coupled Device (CCD) offers the unique possibility of simultaneously fulfilling requirements for high angular resolution (1/4 arcsec -- 12 µm), high quantum efficiency (> 50% from 1 to 7 keV), and moderate spectral resolution (E/A E > 5 E). We have verified detection and localization of single X-ray photons. Our studies have established many of the requirements for application to the Advanced X-ray Astronomy Facility (AXAF) telescope: the device must be cooled, must be readout in no more than 0.3 sec, and must have a thickness of at least 50 p.m both to detect 7 keV X-rays efficiently and to provide a clear discriminant against cosmic rays and charged particles. We use an algorithm to recognize event existence and then sum charge from several adjacent pixels to obtain the position centroid location and to optimize the energy resolution. With some technological advances, CCD's might also replace separate low angular resolution instruments currently used to obtain a wide energy range (0.1-10 keV) and a large field of view (1°).

Citation Download Citation

D. A. Schwartz, R. E. Griffiths, S. S. Murray, M. V. Zombeck, and W. Bradley "Use Of A Charge-Coupled Device In X-Ray Astronomy As A High-Resolution Imaging Detector With Spectral Resolution", Proc. SPIE 0184, Space Optics Imaging X-Ray Optics Workshop, (9 August 1979); https://doi.org/10.1117/12.957458

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