Microprocessor-Controlled Photodetector Test Console

Eustace L. Dereniak; Earl M. Hicks; John J. Speer; Arthur M. McDevitt

doi:10.1117/12.958814

8 August 1980 Microprocessor-Controlled Photodetector Test Console

Eustace L. Dereniak, Earl M. Hicks, John J. Speer, Arthur M. McDevitt

Proceedings Volume 0230, Minicomputers and Microprocessors in Optical Systems; (1980) https://doi.org/10.1117/12.958814
Event: 1980 Technical Symposium East, 1980, Washington, D.C., United States

Abstract

The integration of a microprocessor into a detector test console is described. Responsivity and D* measurements are performed as a function of frequency, detector bias voltage, and detector temperature. The system has been designed for use with a photoconductor test console; however, minor modifications will allow it to be used for evaluation of other detector types. Detector tests for a single photoconductor element usually require about 250 data points to fully characterize its optimum operating temperature, bias, and frequency response. The increasing importance of high density detector focal plane arrays with 100 elements or more has stimulated interest in microprocessor control to reduce operator fatigue and other human engineering problems. Therefore, a data collection and analysis scheme using a microprocessor can give test results that are not only more accurate but much less expensive. This system costs about $2500 to integrate into an appropriate existing detector test console.

Citation Download Citation

Eustace L. Dereniak, Earl M. Hicks, John J. Speer, and Arthur M. McDevitt "Microprocessor-Controlled Photodetector Test Console", Proc. SPIE 0230, Minicomputers and Microprocessors in Optical Systems, (8 August 1980); https://doi.org/10.1117/12.958814

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