Reflectivity And Roughness Of Layered Synthetic Microstructures

O J Petersen; J M Thorne; L V Knight; T W Barbee Jr.

doi:10.1117/12.939175

27 March 1984 Reflectivity And Roughness Of Layered Synthetic Microstructures

O J Petersen, J M Thorne, L V Knight, T W Barbee Jr.

Proceedings Volume 0447, Science with Soft X-Rays; (1984) https://doi.org/10.1117/12.939175
Event: 1983 Brookhaven Conference: Science with Soft X-Rays, 1983, Upton, United States

Abstract

The effect of uncorrelated roughness on the reflectivity of layered synthetic microstructures (LSM's) is studied. A computer code which includes uncorrelated roughness is developed allowing the subtraction of roughness from experimental measurements. This allows the use of LSM's to measure the optical constants of materials in the x-ray region of the spectrum. The method is applied to an V/C LSM to measure the resonance correction to the atomic factor, f', across the vanadium K-absorption edge.

Citation Download Citation

O J Petersen, J M Thorne, L V Knight, and T W Barbee Jr. "Reflectivity And Roughness Of Layered Synthetic Microstructures", Proc. SPIE 0447, Science with Soft X-Rays, (27 March 1984); https://doi.org/10.1117/12.939175

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