Molecular Beam Epitaxy Studies Of A-Sn/CdTe Superlattices

Hartmut Hochst; David W. Niles; Isaac Hernandez-Calderon

doi:10.1117/12.943953

3 May 1988 Molecular Beam Epitaxy Studies Of α-Sn/CdTe Superlattices

Hartmut Hochst, David W. Niles, Isaac Hernandez-Calderon

Proceedings Volume 0878, Multifunctional Materials; (1988) https://doi.org/10.1117/12.943953
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States

Abstract

Angular-resolved synchrotron radiation photoemission spectroscopy and reflection high energy electron diffraction (RHEED) are used to study the MBE growth and the thermal stability of α-Sn/CdTe(110) and CdTe/α-Sn(110) interfaces. Both interfaces are found to be stable, nonreactive, and abrupt for growth temperatures up to 100 C. At the α-Sn/CdTe interface we measured a valence band offset of ΔEv = 1.1eV. Shifts in the Sn4d core level and valence band spectra suggest a bandgap in a 50 monolayer (ML) thick α-Sn film of at least ΔEg ≥ 200meV. Stable superlattices of α-Sn/CdTe(110) have been grown at 100 C. The surface quality of the superstructure degrades after the growth of several α-Sn/CdTe periods. After the growth of 10 periods each 50 ML thick, the RHEED pattern shows mainly three dimensional bulk diffraction, indicating increased surface and interface roughness.

Citation Download Citation

Hartmut Hochst, David W. Niles, and Isaac Hernandez-Calderon "Molecular Beam Epitaxy Studies Of α-Sn/CdTe Superlattices", Proc. SPIE 0878, Multifunctional Materials, (3 May 1988); https://doi.org/10.1117/12.943953

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