Measurement Of Refractive Indices By Grating Coupling

R. G. Kaufman; A. L. Moretti; D. J. Vezzetti; F. A. Chambers; R. Wickman

doi:10.1117/12.947321

18 August 1988 Measurement Of Refractive Indices By Grating Coupling

R. G. Kaufman, A. L. Moretti, D. J. Vezzetti, F. A. Chambers, R. Wickman

Proceedings Volume 0943, Quantum Well and Superlattice Physics II; (1988) https://doi.org/10.1117/12.947321
Event: Advances in Semiconductors and Superconductors: Physics and Device Applications, 1988, Newport Beach, CA, United States

Abstract

We present the results of measurements, by means of a grating coupling method, of the index of refraction of several bulk materials and of slab waveguides of the GaAs/AlGaAs system. Preliminary results show good agreement with literature values obtained by other methods.

Citation Download Citation

R. G. Kaufman, A. L. Moretti, D. J. Vezzetti, F. A. Chambers, and R. Wickman "Measurement Of Refractive Indices By Grating Coupling", Proc. SPIE 0943, Quantum Well and Superlattice Physics II, (18 August 1988); https://doi.org/10.1117/12.947321

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