A fast double shutter for CCD-based metrology

R. Geisler

doi:10.1117/12.2269099

20 February 2017 A fast double shutter for CCD-based metrology

R. Geisler

Proceedings Volume 10328, Selected Papers from the 31st International Congress on High-Speed Imaging and Photonics; 1032809 (2017) https://doi.org/10.1117/12.2269099
Event: 31st International Congress on High-Speed Imaging and Photonics, 2016, Osaka, Japan

Abstract

Image based metrology such as Particle Image Velocimetry (PIV) depends on the comparison of two images of an object taken in fast succession. Cameras for these applications provide the so-called ‘double shutter’ mode: One frame is captured with a short exposure time and in direct succession a second frame with a long exposure time can be recorded. The difference in the exposure times is typically no problem since illumination is provided by a pulsed light source such as a laser and the measurements are performed in a darkened environment to prevent ambient light from accumulating in the long second exposure time. However, measurements of self-luminous processes (e.g. plasma, combustion ...) as well as experiments in ambient light are difficult to perform and require special equipment (external shutters, highspeed image sensors, multi-sensor systems ...). Unfortunately, all these methods incorporate different drawbacks such as reduced resolution, degraded image quality, decreased light sensitivity or increased susceptibility to decalibration. In the solution presented here, off-the-shelf CCD sensors are used with a special timing to combine neighbouring pixels in a binning-like way. As a result, two frames of short exposure time can be captured in fast succession. They are stored in the on-chip vertical register in a line-interleaved pattern, read out in the common way and separated again by software. The two resultant frames are completely congruent; they expose no insensitive lines or line shifts and thus enable sub-pixel accurate measurements. A third frame can be captured at the full resolution analogue to the double shutter technique. Image based measurement techniques such as PIV can benefit from this mode when applied in bright environments. The third frame is useful e.g. for acceleration measurements or for particle tracking applications.

Citation Download Citation

R. Geisler "A fast double shutter for CCD-based metrology", Proc. SPIE 10328, Selected Papers from the 31st International Congress on High-Speed Imaging and Photonics, 1032809 (20 February 2017); https://doi.org/10.1117/12.2269099

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