Open Access Paper
7 September 2017 Front Matter: Volume 10334
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 10334, including the Title Page, Copyright information, Table of Contents, and Conference Committee listing.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Automated Visual Inspection and Machine Vision II, edited by Jürgen Beyerer, Fernando Puente León, Proceedings of SPIE Vol. 10334 (SPIE, Bellingham, WA, 2017) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510611139

ISBN: 9781510611146 (electronic)

Published by

SPIE

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Copyright © 2017, Society of Photo-Optical Instrumentation Engineers.

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Publication of record for individual papers is online in the SPIE Digital Library.

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Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the

time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Alekhin, Artem A., 0R

Altmann, Bettina, 0A

Anisimov, Andrei G., 0G

Apel, Uwe, 04

Arbuzova, Evgeniia A., 0U

Artigas, Roger, 0C

Aulbach, Laura, 03

Bauer, Sebastian, 08

Bergmann, Stephan, 06

Bermudez, Carlos, 0C

Beyerer, Jürgen, 06

Bey-Temsamani, Abdellatif, 02

Cadevall, Cristina, 0C

Cai, Lei, 0K

Cao, Zhiguo, 0F, 0H

Chen, Ran, 0O

Cheng, Xu, 0O

Chertov, Aleksandr N., 0T, 0U

Czymmek, Vitali, 0P

Dachsbacher, Carsten, 06

Dantanarayana, Harshana G., 0D

Farsani, Raziyeh A., 04

Fuersattel, Peter, 0V

Glebov, Victor, 0E

Gorbunova, Elena V., 0T, 0U

Grelcke, Michael, 0P

Gronle, Marc, 05

Haist, Tobias, 05

Han, Liya, 0O

Holtorf, Tim, 0P

Huntley, Jonathan M., 0D

Hussmann, Stephan, 0P

Ibañez, Sergi, 0C

Irgenfried, Stephan, 06

Ivanov, Alexander N., 0L

Júlio, Eduardo, 07

Knoll, Florian J., 0P

Knyaz, V. A., 0Q

Koch, Alexander W., 03

Korotaev, Valery V., 0U

Krippner, Wolfgang, 08

Laguarta, Ferran, 0C

Lashmanov, Oleg, 0E

Li, Bo, 0K

Li, Ran, 0F

Li, Ruibo, 0H

Li, Zhongwei, 0O

Lu, Min, 03

Lv, Jing, 0M

Lv, Wen, 0I, 0K, 0M

Maier, Andreas, 0V

Matilla, Aitor, 0C

Minnigazimov, Ramil I., 0L

Mohammadikaji, Mahsa, 06

Molchanov, V. V., 0Q

Nizhegorodova, Ksenia V., 0L

Ompusunggu, Agusmian P., 02

Oramas, Jose, 02

Osten, Wolfgang, 05

Pape, Christian, 0A

Patra, Sayantani, 0X

Peretyagin, Vladimir S., 0U

Porokhin, Vyacheslav V., 0L

Pratiher, Sawon, 0X

Pratiher, Souvik, 0X

Puente León, Fernando, 08

Reithmeier, Eduard, 0A

Riess, Christian, 0V

Rozhkova, Natalia N., 0T

Sadovnichii, Roman V., 0T

Salazar Bloise, Félix, 03

Santos, Bruno O., 07

Schaller, Christian, 0V

Serikova, Mariya G., 0G

Shi, Yusheng, 0O

Sidyakin, S. V., 0J

Solovey, Alexey A., 0R

Sure, Thomas, 04

Trushkina, Anna V., 0G

Tuytelaars, Tinne, 02

Valença, Jonatas, 07

Vasilev, Aleksandr S., 0G

Vishnyakov, B. V., 0J, 0Q

Vishnyakova, O. V., 0Q

Vizilter, Y. V., 0Q

Wagner, Felix, 08

Wang, Lin, 0K

Wang, Shengjia, 03

Wörn, Heinz, 06

Xian, Ke, 0F

Xiao, Yang, 0F, 0H

Yang, Haiyue, 05

Ye, Qi, 0M

Yi, Jie, 0O

Zakirov, Anvar K., 0L

Zhan, Guomin, 0O

Zhang, Libao, 0I, 0K, 0M

Zhang, Qian, 0F, 0H

Zhang, Runze, 0H

Zhong, Kai, 0O

Zhu, Yongchun, 0I

Conference Committee

Symposium Chair

  • Wolfgang Osten, Universität Stuttgart (Germany)

Conference Chairs

  • Jürgen Beyerer, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB (Germany) and Karlsruher Institut für Technologie (Germany)

  • Fernando Puente León, Karlsruher Institut für Technologie (Germany)

Conference Programme Committee

  • Christian Frese, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • Andreas Heinrich, Hochschule Aalen (Germany)

  • Michael Heizmann, Karlsruher Institut für Technologie (Germany)

  • Bernd Jähne, Ruprecht-Karls-Universität Heidelberg (Germany)

  • Thomas Längle, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • Markus Maurer, VITRONIC Dr.-Ing. Stein Bildverarbeitungssysteme GmbH (Germany)

  • Wolfgang Osten, Universität Stuttgart (Germany)

  • Felix Salazar, Universidad Politécnica de Madrid (Spain)

  • Robert Schmitt, Fraunhofer-Institut für Produktionstechnologie (Germany)

  • Hugo Thienpont, Vrije Universiteit Brussel (Belgium)

  • Stefan Werling, Duale Hochschule Baden-Würtemberg (Germany)

  • Ernst Wiedenmann, Serious Enterprises (Germany)

  • Volker Willert, Technische Universität Darmstadt (Germany)

Session Chairs

1 Image Acquisition

  • Jürgen Beyerer, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

2 Simulation

  • Fernando Puente León, Karlsruher Institut für Technologie (Germany)

3 Multispectral Inspection

  • Jürgen Beyerer, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

4 Inspection, Monitoring, and Detection

  • Fernando Puente León, Karlsruher Institut für Technologie (Germany)

© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 10334", Proc. SPIE 10334, Automated Visual Inspection and Machine Vision II, 1033401 (7 September 2017); https://doi.org/10.1117/12.2284245
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KEYWORDS
Inspection

CMOS sensors

Machine vision

3D modeling

Computer simulations

Computing systems

Error analysis

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