Optoelectronic system modulation transfer function measurement based on the method of summation over different frequencies harmonic functions

Oleg A. Perezyabov; Aleksandr V. Ilinski; Nadezhda K. Maltseva

doi:10.1117/12.2312581

15 June 2018 Optoelectronic system modulation transfer function measurement based on the method of summation over different frequencies harmonic functions

Oleg A. Perezyabov, Aleksandr V. Ilinski, Nadezhda K. Maltseva

Author Affiliations +

Proceedings Volume 10692, Optical Fabrication, Testing, and Metrology VI; 1069217 (2018) https://doi.org/10.1117/12.2312581
Event: SPIE Optical Systems Design, 2018, Frankfurt, Germany

Abstract

Optoelectronic devices based on array image sensors become more popular every year. They are used in science applications, as the machine vision systems and used by customers all over the world for image recording purpose. The quality of the image received by any optoelectronic system depends on several factors and such characteristic as its resolution turns out to be one of the most important. There are several ways to describe the optoelectronic system resolution. One of the most widespread is modulation transfer function. The modulation transfer function measurements could be fulfilled with the help of a method of summation over different frequencies harmonic functions. This method is accurate in the range of Nyquist frequency and closely meets the definition of the modulation transfer function as the harmonic functions are used. It also allows to input necessary frequencies by adding the sinusoid of corresponding frequency to the initial function. In this paper we describe the experiment of optoelectronic system modulation transfer function measurement using the above mentioned method.

Citation Download Citation

Oleg A. Perezyabov, Aleksandr V. Ilinski, and Nadezhda K. Maltseva "Optoelectronic system modulation transfer function measurement based on the method of summation over different frequencies harmonic functions", Proc. SPIE 10692, Optical Fabrication, Testing, and Metrology VI, 1069217 (15 June 2018); https://doi.org/10.1117/12.2312581

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