Effect of aberration on the electric field orientation around the focus of a polarized light beam

Ranjan Kalita; Bosanta R. Boruah

doi:10.1117/12.2320177

18 September 2018 Effect of aberration on the electric field orientation around the focus of a polarized light beam

Ranjan Kalita, Bosanta R. Boruah

Proceedings Volume 10772, Unconventional and Indirect Imaging, Image Reconstruction, and Wavefront Sensing 2018; 107720Y (2018) https://doi.org/10.1117/12.2320177
Event: SPIE Optical Engineering + Applications, 2018, San Diego, California, United States

Abstract

A polarized light scanning optical microscopy is an important imaging technique popular for its ability to determine the information on molecular orientation of the sample being studied. The determination of the molecular orientation directly depends on the electric field orientation around the focus of a lens, which is used to focus the light to illuminate the sample. In this paper, we present the effect on the electric field orientation at the focal plane of the lens due to the presence of a few primary optical aberration present in the light beam.

Citation Download Citation

Ranjan Kalita and Bosanta R. Boruah "Effect of aberration on the electric field orientation around the focus of a polarized light beam", Proc. SPIE 10772, Unconventional and Indirect Imaging, Image Reconstruction, and Wavefront Sensing 2018, 107720Y (18 September 2018); https://doi.org/10.1117/12.2320177

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