Paper
24 July 2018 A method of vision localization measurement to assist Fourier ptychographic microscopy
Author Affiliations +
Proceedings Volume 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018); 108270J (2018) https://doi.org/10.1117/12.2501042
Event: Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018), 2018, Shanghai, China
Abstract
Fourier ptychographic microscopy (FPM) is a new imaging technology developed in recent years, which can achieve a high-resolution imaging with large field of view (FOV). In FPM, the imaging retrieval quality depends on the exact position of the LED array, and there exists position errors of LED array in practice. To obtain the accurate position, this paper proposes a method of vision assisted localization to determine the coordinates of LED array, which can provide the accurate LED ray directions for improving FPM. Additionally, a multi-resolution reference is built to settle the inconsistent FOV between the FPM system and vision assisted system. The experiments are performed to illuminate the efficiency and capability of flexible application because of no LED array aligning considered.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiaoli Liu, Cheng Li, Qijian Tang, and Xiang Peng "A method of vision localization measurement to assist Fourier ptychographic microscopy", Proc. SPIE 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018), 108270J (24 July 2018); https://doi.org/10.1117/12.2501042
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Stereo vision systems

Imaging systems

Microscopy

Image processing

Spatial frequencies

Cameras

Back to Top