Research on noise testing and reduction of low illumination imaging module

Kai Qiao; Shengkai Wang; Gangcheng Jiao; Hongjin Qiu; Hongchang Cheng; Yuanyuan

doi:10.1117/12.2521984

12 March 2019 Research on noise testing and reduction of low illumination imaging module

Kai Qiao, Shengkai Wang, Gangcheng Jiao, Hongjin Qiu , Hongchang Cheng, Yuanyuan

Proceedings Volume 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application; 1102327 (2019) https://doi.org/10.1117/12.2521984
Event: Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 2018, Xi'an, China

Abstract

As the rapid development of back-illuminated CMOS (BI-CMOS) image sensor technology in recent years, its application prospect in the field of Low-Light-Level (LLL) night vision has been widely concerned. Therefore, LLL imaging module was developed based on BICMOS, whose 3-D noise data was obtained under different illumination conditions. The test results show that, the signal-to-noise ratio (SNR) of imaging module becomes worse with the decreasing of illumination. According to the judgement of noise, the noise power of the image in low illumination is mainly Gaussian distribution. And the image processed by spatial filtering, which efficiently reducing the imaging noise and improving the imaging quality.

Citation Download Citation

Kai Qiao, Shengkai Wang, Gangcheng Jiao, Hongjin Qiu , Hongchang Cheng, and Yuanyuan "Research on noise testing and reduction of low illumination imaging module", Proc. SPIE 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 1102327 (12 March 2019); https://doi.org/10.1117/12.2521984

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KEYWORDS

Signal to noise ratio

Interference (communication)

3D modeling

Image quality

3D image processing

Image processing

Imaging systems

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