Self-interference digital holography (SIDH) for far-field three-dimensional nanoscale localization of fluorescent nanoparticles

Abhijit Marar; Peter Kner

doi:10.1117/12.2543422

13 February 2020 Self-interference digital holography (SIDH) for far-field three-dimensional nanoscale localization of fluorescent nanoparticles

Abhijit Marar, Peter Kner

Author Affiliations +

Proceedings Volume 11246, Single Molecule Spectroscopy and Superresolution Imaging XIII; 112460M (2020) https://doi.org/10.1117/12.2543422
Event: SPIE BiOS, 2020, San Francisco, California, United States

Abstract

Self-interference digital holography (SIDH) is a promising approach for three-dimensional imaging as it offers the ability to view a complete three-dimensional volume from a single image. SIDH has so far, largely been limited to image samples that emit a large number of photons. We report the use of a Michelson interferometer based SIDH setup which provides higher light throughput compared to previous systems that employed spatial light modulators (SLM). SIDH microscopy incorporating a Michelson interferometer in the proposed optical configuration and high-numerical-aperture oil immersion objectives can be used to perform super-resolution single-molecule localization microscopy (SMLM) and single-particle tracking (SPT) over large axial ranges. We demonstrate this by localizing a single 0.1 µm diameter fluorescent nanosphere using a custom built wide-field microscope. With 49,000 photons detected, the proposed system achieves a localization precision of 4.5 nm in x, 5 nm in y and 39.8 nm in z over a 20 µm axial range. Further, we also discuss the SNR requirements to image photon-limited light sources such as a single-molecules using SIDH.

Conference Presentation

Citation Download Citation

Abhijit Marar and Peter Kner "Self-interference digital holography (SIDH) for far-field three-dimensional nanoscale localization of fluorescent nanoparticles", Proc. SPIE 11246, Single Molecule Spectroscopy and Superresolution Imaging XIII, 112460M (13 February 2020); https://doi.org/10.1117/12.2543422

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