Design and analysis of trench-based novel structure for high-sensitive surface plasmon resonance sensor

Manish Kumar; Ajay Kumar; Sanjeev Kumar Raghuwanshi

doi:10.1117/12.2545464

2 March 2020 Design and analysis of trench-based novel structure for high-sensitive surface plasmon resonance sensor

Manish Kumar, Ajay Kumar, Sanjeev Kumar Raghuwanshi

Proceedings Volume 11274, Physics and Simulation of Optoelectronic Devices XXVIII; 1127414 (2020) https://doi.org/10.1117/12.2545464
Event: SPIE OPTO, 2020, San Francisco, California, United States

Abstract

In this paper, a trench-based novel structure for high-sensitive surface plasmon resonance sensor (SPR), sensitivity enhancement has been observed and presented. The novel structure provides localization of a large fraction of the light energy inside a layer that is adjacent to the outer surface of a metal coating on the sensor. In this technique, a propagating surface plasmon gets confined typically by illuminating thin, multilayer metal films through the novel structure. The novel structure helps to extend more localization of the plasmonic field into the buffer medium where sensing has to occur. The trench-based SPR sensor has excellent optical properties, further enhanced the sensitivity compared with the conventional SPR. The change chemical parameter result directly gives the change in refractive indexes of sensing materials corresponds to change in radiation wavelength, reflectivity, phase for a specific incidence angle.

Conference Presentation

Citation Download Citation

Manish Kumar, Ajay Kumar, and Sanjeev Kumar Raghuwanshi "Design and analysis of trench-based novel structure for high-sensitive surface plasmon resonance sensor", Proc. SPIE 11274, Physics and Simulation of Optoelectronic Devices XXVIII, 1127414 (2 March 2020); https://doi.org/10.1117/12.2545464

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