Noise characterization of megapixel quanta image sensor for scientific applications

Dakota S. Robledo; Yu-Wing Chung; Saleh Masoodian; Jiaju Ma

doi:10.1117/12.2542862

31 January 2020 Noise characterization of megapixel quanta image sensor for scientific applications

Dakota S. Robledo, Yu-Wing Chung, Saleh Masoodian, Jiaju Ma

Proceedings Volume 11288, Quantum Sensing and Nano Electronics and Photonics XVII; 1128826 (2020) https://doi.org/10.1117/12.2542862
Event: SPIE OPTO, 2020, San Francisco, California, United States

Abstract

The quanta image sensor (QIS) is a novel CMOS-based image sensor capable of photon counting without the necessity of avalanche gain. The QIS reported in this work is implemented in a state-of-the-art backside-illuminated (BSI) CMOS image sensor commercial stacking (3D) process. The detector wafer consists of a megapixel array of specialized active pixels known as “jots” and the ASIC readout wafer utilizes cluster-based readout circuitry. This specialized pixel architecture and cluster readout circuits allow for the QIS to achieve accurate photon-counting capabilities with average read noise of 0.23e- rms, average conversion gain of 345μV/e-, and average dark current less than 0.1e-/sec/jot at room temperature without active cooling.

Citation Download Citation

Dakota S. Robledo, Yu-Wing Chung, Saleh Masoodian, and Jiaju Ma "Noise characterization of megapixel quanta image sensor for scientific applications", Proc. SPIE 11288, Quantum Sensing and Nano Electronics and Photonics XVII, 1128826 (31 January 2020); https://doi.org/10.1117/12.2542862

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