Establishing the optical refrigeration of semiconductors remains a longstanding goal due to potential applications in optoelectronics. Apart from stringent materials requirements, required to realize condensed phase laser cooling, namely the need to have near unity emission quantum yields, a practical challenge involves accurately measuring specimen temperatures in a non-contact fashion. Common all-optical approaches developed in response to this need include: pump– probe luminescence thermometry (PPLT) and differential luminescence thermometry (DLT). In this study, we compare and contrast PPLT and DLT to a newly developed up-conversion emission thermometry to establish the most robust approach for measuring semiconductor nanocrystal (NC) temperatures. Using high external quantum efficiency CdSe/CdS core/shell NCs, we reveal that up-conversion emission thermometry possesses higher accuracy than either PPLT or DLT. Up-conversion emission thermometry can also be used on specimens such as CsPbBr3 NCs with temperature-insensitive band gaps.
|