CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 11369 > Article
Paper
6 February 2020 Defect structure of high-resistivity CdTe:Cl crystals according to the data of high-resolution x-ray diffractometry
I. Fodchuk, A. Kuzmin, I. Hutsuliak, M. Solodkyi, V. Dovganyuk, O. Maslyanchuk, Yu. Roman, R. Zaplitnyy, O. Gudymenko, V. Kladko, V. Mоlоdkin, V. Lizunov
Author Affiliations +
Proceedings Volume 11369, Fourteenth International Conference on Correlation Optics; 113691H (2020) https://doi.org/10.1117/12.2553970
Event: Fourteenth International Conference on Correlation Optics, 2019, Chernivtsi, Ukraine
Abstract
The degree of structural perfection of CdTe:Cl single crystals was estimated by methods of high-resolution Xray diffractometry. Two possible systems of dislocations that consists of two sets of complete 60-degree dislocations and Frank partial dislocations were investigated with the use of Krivoglaz kinematic theory and Monte Carlo method. The density of dislocations that provides correspondence between experimental and simulated reciprocal space maps is determined.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
I. Fodchuk, A. Kuzmin, I. Hutsuliak, M. Solodkyi, V. Dovganyuk, O. Maslyanchuk, Yu. Roman, R. Zaplitnyy, O. Gudymenko, V. Kladko, V. Mоlоdkin, and V. Lizunov "Defect structure of high-resistivity CdTe:Cl crystals according to the data of high-resolution x-ray diffractometry", Proc. SPIE 11369, Fourteenth International Conference on Correlation Optics, 113691H (6 February 2020); https://doi.org/10.1117/12.2553970
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 12 PAGES
DOWNLOAD PAPER SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Crystals
Monte Carlo methods
X-rays
Cadmium
X-ray diffraction
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top